The method enables the reference-free determination of refraction index, absorption coefficient and structural properties of a sample by means of polarisation-dependent optical methods. An example for a potential application is the analysis of electrical excitement in new materials and thin layers with a thickness in the micrometre range through to atomic layers. The measurements provide details on electronic properties, crystallinity and structure.
The device is operated in cooperation with the PTB (Physikalisch-Technische Bundesanstalt), Germany's national metrology institute, and is established in the Metrology Light Source storage ring at PTB.