Ries M,
Poliani E,
Nippert F,
Seidlitz D,
Greif LTH,
Koslow I,
Bläsing J,
Maur MAD,
Hoffmann A,
Esser N,
Wagner MR.
Impact of nanoscale fluctuations and cap-layer thickness in buried InGaN single quantum wells probed by tip-enhanced Raman scattering
Journal of Applied Physics, Vol. 2023, Nr. 9,
Type: Journal article