The method enables the reference-free determination of refraction index, absorption coefficient and structural properties of a sample by means of polarisation-dependent optical methods. An example for a potential application is the analysis of electrical excitement in new materials and thin layers with a thickness in the micrometre range through to atomic layers. The measurements provide details on electronic properties, crystallinity and structure.

The device is operated in cooperation with the PTB (Physikalisch-Technische Bundesanstalt), Germany's national metrology institute, and is established in the Metrology Light Source storage ring at PTB.

Contact person

  • Prof. Dr. Norbert Esser
  • T: 0231 1392-3530
  • E: efisvik.vjjvi@zjrj.uv

Other services

Peptide synthesis and amino acid analysis

Our services include the synthesis of peptide standards for precise and robust protein quantification.
Read more

Polarisation-dependent infrared spectroscopy and ellipsometry

This technique is particularly well suited for investigating new materials, metamaterials, hybrid materials and thin organic and inorganic layers.
Learn more

Proteome analysis via LC-MS

ISAS is equipped with the latest LC-MS systems which enable us to reliably identify proteins.
Read more

Relative protein quantification by means of LC-MS

In addition to qualitative analyses, our Technical Services Bioanalytics also offers to quantify proteins.
Read more